The Materials Characterization Laboratory offers thermal, optical, microscopic, electrical, and magnetic characterization of materials and elemental analysis of surfaces via a wide range of instruments including: (1) light scattering spectrometers, (2) several spectrophotometers, (3) scanning probe microscopes (AFM/STM), (4) a SQUID magnetometer, (5) a scanning electron microscope, and (6) an X-Ray photoelectron spectrometer. This laboratory is a part of the UCLA Molecular Instrumentation Center.

For more information, please visit the Materials Characterization Laboratory site.

Last updated
September 27, 2023